Universidad de Costa Rica

Dynamic IEEE 9-Bus Modified Test System

Ing. Jairo Quirós Tortós, PhD.
Panayiotis Demetriou and Markos Asprou and Jairo Quiros-Tortos and Elias Kyriakides
University of Cyprus


The IEEE test bed systems available in the literature for steady-state studies are extended and modified to consider dynamic data for time-domain simulations. The dynamic parameters for a sixth order full machine model (ie, machine, exciter, and governor) are defined for each generator in the IEEE test systems. Dynamic parameters are also determined for the condensers and motors. The dynamic parameters are based on typical dynamic models provided in Power system control and stability (PM Anderson, AA Fouad). More details about how the IEEE test systems are extended and modified to account for the dynamic parameters of typical dynamic models can be found in P. Demetriou, M. Asprou, J. Quirós-Tortós, and E. Kyriakides,“Dynamic IEEE Test Systems for Transient Analysis,” IEEE Systems Journal, Early access. The proposed dynamic test systems can be used for …

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